Scholarly Index
Farid N. Najm
University of Toronto; 7,452 total citations; 229 total publications; best world rank #42
University of Toronto
7,452Total citations
229Total publications
40H-index
Published ranking records
| Field | Window | World rank | National rank | Impact score |
|---|---|---|---|---|
| VLSI and Analog Circuit Testing | Lifetime | 53 | CA 3 | 99.31 |
| Low-power high-performance VLSI design | Lifetime | 71 | CA 4 | 99.38 |
| VLSI and FPGA Design Techniques | Lifetime | 42 | CA 2 | 99.10 |
| Copper Interconnects and Reliability | Lifetime | 220 | CA 6 | 97.53 |
| Embedded Systems Design Techniques | Lifetime | 391 | CA 12 | 97.48 |
| Radiation Effects in Electronics | Lifetime | 297 | CA 6 | 96.24 |
| Electromagnetic Compatibility and Noise Suppression | Lifetime | 513 | CA 37 | 96.45 |
| Electronic Packaging and Soldering Technologies | Lifetime | 760 | CA 14 | 94.43 |
| Copper Interconnects and Reliability | 2021-2025 | 159 | CA 1 | 79.85 |